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Showing 1 - 8 results of 8 for search '"Quality control"' Refine Results
  1. 1
    Optical inspection and testing : proceedings of a conference held 17-18 November 1992, Boston, Massachusetts / sponsored by SPIE--The International Society for Optical Engineering ; James D. Trolinger, editor.
    Published 1993
    Subjects: '; “...Quality control Optical methods Congresses...”
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  2. 2
    Machine vision systems integration : proceedings of a conference held 6-7 November 1990, Boston, Massachusetts / Bruce G. Batchelor, Frederick M. Waltz, editors ; sponsored by SPIE--The International Society for Optical Engineering.
    Published 1991
    Subjects: '; “...Quality control Optical methods Automation Congresses...”
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  3. 3
    Machine vision applications in industrial inspection XIII : 17-18 January 2005, San Jose, California, USA / Jeffery R. Price, Fabrice Meriaudeau, chairs/editors ; sponsored and published by IS&T--the Society for Imaging Science and Technology [and] SPIE--the International Society for Optical Engineering.
    Published 2005
    Subjects: '; “...Quality control Automation Congresses...”
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  4. 4
    Machine vision applications in industrial inspection XI : 22-24 January, 2003, Santa Clara, California, USA / Martin A. Hunt, Jeffery R. Price, chairs/editors ; sponsored and published by IS & T--the Society for Imaging Science and Technology, SPIE--the International Society for Optical Engineering.
    Published 2003
    Subjects: '; “...Quality control Optical methods Automation Congresses...”
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  5. 5
    Machine vision applications in industrial inspection XII : 21-22 January, 2004, San Jose, California, USA / Jeffery R. Price, Fabrice Mériaudeau, chairs/editors ; sponsored by IS & T--the Society for Imaging Science and Technology, SPIE--the International Society for Optical Engineering.
    Published 2004
    Subjects: '; “...Quality control Optical methods Automation Congresses...”
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  6. 6
    Machine vision applications in industrial inspection XIV : 16-17 January, 2006, San Jose, California, USA / Fabrice Meriaudeau, Kurt S. Niel, chairs/editors ; sponsored by IS&T--the Society for Imaging Science and Technology [and] SPIE--the International Society for Optical Engineering.
    Published 2006
    Subjects: '; “...Quality control Optical methods Automation Congresses...”
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  7. 7
    Machine vision and three-dimensional imaging systems for inspection and metrology : 6-8 November 2001 [i.e. 2000], Boston, USA / Kevin G. Harding, John W. V. Miller, Bruce G. Batchelor, chairs/editors ; sponsored ... by SPIE--the International Society for Optical Engineering.
    Published 2001
    Subjects: '; “...Quality control Optical methods Congresses...”
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  8. 8
    Industrial optical sensors for metrology and inspection : 31 October-1 November 1994, Boston, Massachusetts / Kevin G. Harding, H. Philip Stahl, chairs/editors ; sponsored and published by SPIE--the International Society for Optical Engineering..
    Published 1995
    Subjects: '; “...Quality control Optical methods Congresses...”
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