Machine vision and three-dimensional imaging systems for inspection and metrology : 6-8 November 2001 [i.e. 2000], Boston, USA / Kevin G. Harding, John W. V. Miller, Bruce G. Batchelor, chairs/editors ; sponsored ... by SPIE--the International Society for Optical Engineering.

Machine vision and three-dimensional imaging systems for inspection and metrology : 6-8 November 2001 [i.e. 2000], Boston, USA / Kevin G. Harding, John W. V. Miller, Bruce G. Batchelor, chairs/editors ; sponsored ... by SPIE--the International Society for Optical Engineering. 6-8 November 2001 [i.e. 2000], Boston, USA /

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Bibliographic Details
Corporate Author: Society of Photo-optical Instrumentation Engineers
Other Authors: Batchelor, Bruce G., Harding, Kevin G., Miller, John W. V.
Format: Book
Language:English
Published: Bellingham, Wash., USA : SPIE, c2001.
Series:SPIE proceedings series ; v. 4189
Subjects:
Computer vision > Congresses
Computer vision > Industrial applications > Congresses
Three-dimensional display systems > Congresses
Quality control > Optical methods > Congresses
Metrology > Congresses
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Pilkington Library - Pilkington Main Collection

Shelfmark: 681.2/MAC
Copy [0402766598] Available

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