Machine vision applications in industrial inspection XI : 22-24 January, 2003, Santa Clara, California, USA / Martin A. Hunt, Jeffery R. Price, chairs/editors ; sponsored and published by IS & T--the Society for Imaging Science and Technology, SPIE--the International Society for Optical Engineering.

Machine vision applications in industrial inspection XI : 22-24 January, 2003, Santa Clara, California, USA / Martin A. Hunt, Jeffery R. Price, chairs/editors ; sponsored and published by IS & T--the Society for Imaging Science and Technology, SPIE--the International Society for Optical Engineering. 22-24 January, 2003, Santa Clara, California, USA /

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Bibliographic Details
Corporate Authors: IS & T-- the Society for Imaging Science and Technology, Society of Photo-optical Instrumentation Engineers
Other Authors: Hunt, Martin A. (Martin Anthony), 1963-, Price, Jeffery Ray, 1970-
Format: Book
Language:English
Published: Bellingham, Wash. : SPIE, c2003.
Series:SPIE proceedings series ; v. 5011
Subjects:
Engineering inspection > Automation > Congresses
Computer vision > Industrial applications > Congresses
Quality control > Optical methods > Automation > Congresses
Mensuration > Congresses
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Pilkington Library - Pilkington Main Collection

Shelfmark: 621.367/MAC
Copy [0403342104] Available

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