Machine vision applications in industrial inspection XII : 21-22 January, 2004, San Jose, California, USA / Jeffery R. Price, Fabrice Mériaudeau, chairs/editors ; sponsored by IS & T--the Society for Imaging Science and Technology, SPIE--the International Society for Optical Engineering. 21-22 January, 2004, San Jose, California, USA /
Saved in:
Corporate Authors: | , |
---|---|
Other Authors: | , |
Format: | Book |
Language: | English |
Published: |
Bellingham, Wash., USA :
SPIE,
c2004.
|
Series: | SPIE proceedings series,
v. 5303 |
Subjects: | |
Tags: |
Add Tag
No Tags, Be the first to tag this record!
|
Pilkington Library - Pilkington Main Collection
Shelfmark: |
621.367/MAC |
---|---|
Copy [0403342112] | Available |