Machine vision applications in industrial inspection XII : 21-22 January, 2004, San Jose, California, USA / Jeffery R. Price, Fabrice Mériaudeau, chairs/editors ; sponsored by IS & T--the Society for Imaging Science and Technology, SPIE--the International Society for Optical Engineering. 21-22 January, 2004, San Jose, California, USA /

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Bibliographic Details
Corporate Authors: IS & T-- the Society for Imaging Science and Technology, Society of Photo-optical Instrumentation Engineers
Other Authors: Price, Jeffery Ray, 1970-, Mériaudeau, Fabrice
Format: Book
Language:English
Published: Bellingham, Wash., USA : SPIE, c2004.
Series:SPIE proceedings series, v. 5303
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Pilkington Library - Pilkington Main Collection

Shelfmark: 621.367/MAC
Copy [0403342112] Available