Machine vision applications in industrial inspection XIV : 16-17 January, 2006, San Jose, California, USA / Fabrice Meriaudeau, Kurt S. Niel, chairs/editors ; sponsored by IS&T--the Society for Imaging Science and Technology [and] SPIE--the International Society for Optical Engineering.

Machine vision applications in industrial inspection XIV : 16-17 January, 2006, San Jose, California, USA / Fabrice Meriaudeau, Kurt S. Niel, chairs/editors ; sponsored by IS&T--the Society for Imaging Science and Technology [and] SPIE--the International Society for Optical Engineering. 16-17 January, 2006, San Jose, California, USA /

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Bibliographic Details
Corporate Authors: IS & T-- the Society for Imaging Science and Technology, Society of Photo-optical Instrumentation Engineers
Other Authors: Mériaudeau, Fabrice, Niel, Kurt S.
Format: Book
Language:English
Published: Bellingham, Wash. : Springfield, Va. : SPIE ; IS&T, c2006.
Series:SPIE proceedings series, v. 6070
Subjects:
Engineering inspection > Automation > Congresses
Computer vision > Industrial applications > Congresses
Quality control > Optical methods > Automation > Congresses
Mensuration > Congresses
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Pilkington Library - Pilkington Main Collection

Shelfmark: 621.367/MAC
Copy [0403342139] Available

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