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  1. 1
    Design to test : a definitive guide for electronic design, manufacture, and service / Jon Turino.
    by Turino, Jon L.
    Published 1990
    Edition: 2nd ed.
    Subjects: '; “...Integrated circuits Testing...”
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  2. 2
    Testing of digital systems / N.K. Jha and S. Gupta.
    by Jha, Niraj K.
    Published 2003
    Subjects: '; “...Digital integrated circuits Testing...”
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  3. 3
    ETS 2009 European Test Symposium : proceedings, 25-29 May, 2009, Sevilla, Spain.
    Published 2009
    Subjects: '; “...Integrated circuits Testing Congresses....”
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  4. 4
    Eleventh IEEE European Test Symposium ETS 2006 : proceedings : 21-24 May, 2006, [Hilton Hotel] Southampton, United Kingdom.
    Published 2006
    Subjects: '; “...Integrated circuits Testing Congresses....”
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  5. 5
    ETS 2007 12th IEEE European Test Symposium : proceedings : 20-24 May 2007, Freiburg, Germany / [sponsored by TTTC].
    Published 2007
    Subjects: '; “...Integrated circuits Testing Congresses....”
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  6. 6
    Proceedings, Thirteenth IEEE European Test Symposium ETS 2008 : 25-29 May, 2008, Verbania, Italy : proceedings / [sponsored by TTTC].
    Published 2008
    Subjects: '; “...Integrated circuits Testing Congresses....”
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  7. 7
    An introduction to mixed-signal IC test and measurement / Mark Burns, Gordon W. Roberts.
    by Burns, Mark, 1962-
    Published 2001
    Subjects: '; “...Integrated circuits Testing...”
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  8. 8
    Design for at-speed test, diagnosis and measurement / edited by Benoit Nadeau-Dostie.
    Published 2000
    Subjects: '; “...Integrated circuits Testing...”
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  9. 9
    Proceedings of the 2009 IEEE Symposium on Design and Diagnostics of Electronic Circuits and Systems April 15-17, 2009, Liberec, Czech Republic / sponsored by IEEE Computer Society, Test Technology Technical Council ; in cooperation with Institute of Information Technology and Electronics of Technical University of Liberec ; [editors, Michel Renovell ... [et al.]].
    Published 2009
    Subjects: '; “...Integrated circuits Testing Congresses....”
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  10. 10
    2008 IEEE Workshop on Design and Diagnostics of Electronic Circuits and Systems proceedings, April 16-18, 2008, Bratislava, Slovaka / sponsored by IEEE Computer Society, Test Technology Technical Council ; in cooperation with Institute of Informatics of the Slovak Academy of Sciences ; [editors, Bernd Straube ... [et al.]].
    Published 2008
    Subjects: '; “...Integrated circuits Testing Congresses....”
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  11. 11
    Proceedings of the 2007 IEEE Workshop on Design and Diagnostics of Electronic Circuits and Systems April 11-13, 2007, Krakow, Poland / sponsored by IEEE Computer Society Test Technology Technical Council ; in cooperation with Silesian University of Technology ; editors, P. Girard ... [et al.].
    Published 2007
    Subjects: '; “...Integrated circuits Testing Congresses....”
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  12. 12
    Digital systems testing and testable design Miron Abramovici, Melvin A. Breuer, Arthur D. Friedman.
    by Abramovici, Miron
    Published 1990
    Subjects: '; “...Digital integrated circuits Testing....”
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  13. 13
    Integrating design and test : using CAE tools for ATE programming / Kenneth P. Parker.
    by Parker, Kenneth P
    Published 1987
    Subjects: '; “...Integrated circuits Testing...”
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  14. 14
    Proceeding of the 15th International Symposium on the Physical & Failure Analysis of Integrated Circuits IPFA 2008 / edited by Gan Chee Lip ... [et al.] ; organised by IEEE ED/SSC Chapter.
    Published 2008
    Subjects: '; “...Integrated circuits Testing Congresses....”
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  15. 15
    ICMTS 2006 proceedings of the 2006 International Conference on Microelectronic Test Structures, Hyatt on Town Lake, Austin, Texas, March 6-9, 2006 / sponsored by the IEEE Electron Devices Society.
    Published 2006
    Subjects: '; “...Integrated circuits Testing Congresses....”
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  16. 16
    Proceedings of the 13th International Symposium on the Physical & Failure Analysis of Integrated Circuits IPFA 2006 / edited by Gan Chee Lip ... [et al.] ; organised by IEEE Reliability/CPMT/ED Singapore Chapter ; technically co-sponsored by IEEE Electron Devices Society ... [et al.] ; in co-operation with Centre for IC Failure Analysis & Reliability (CICFAR), National University of Singapore.
    Published 2006
    Subjects: '; “...Integrated circuits Testing Congresses....”
    Connect to this title online; UW restricted
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  17. 17
    Proceedings of the 14th International Symposium on the Physical & Failure Analysis of Integrated Circuits IPFA 2007 / edited by Souvik Mahapatra, M.K. Radhakrishnan ; organised by IEEE ED/SSC Chapter, Bangalore, India ; technically co-sponsored by IEEE Electron Devices Society ... [et al.] ; in co-operation with IEEE Reliability/CPMT/ED Chapter, Singapore and IEEE ED/AP Chapter, Bombay.
    Published 2007
    Subjects: '; “...Integrated circuits Testing Congresses....”
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  18. 18
    2007 IEEE International Conference on Microelectronic Test Structures ICMTS : conference proceedings : March 19-22, Takeda Hall, The University of Tokyo, Japan / [sponsored by the IEEE Electron Devices Society].
    Published 2007
    Subjects: '; “...Integrated circuits Testing Congresses....”
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  19. 19
    2008 IEEE International Conference on Microelectronic Test Structures ICMTS : conference proceedings : March 24-27, the University of Edinburgh, UK.
    Published 2008
    Subjects: '; “...Integrated circuits Testing Congresses....”
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  20. 20
    Test and diagnosis of analogue, mixed-signal and RF integrated circuits the system on chip approach / Yichuang Sun (ed.).
    Published 2008
    Subjects: '; “...Integrated circuits Testing....”
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