Similar Items

• Proceeding of the 15th International Symposium on the Physical & Failure Analysis of Integrated Circuits IPFA 2008 / edited by Gan Chee Lip ... [et al.] ; organised by IEEE ED/SSC Chapter.
  Published: (2008)
• Proceedings of the 14th International Symposium on the Physical & Failure Analysis of Integrated Circuits IPFA 2007 / edited by Souvik Mahapatra, M.K. Radhakrishnan ; organised by IEEE ED/SSC Chapter, Bangalore, India ; technically co-sponsored by IEEE Electron Devices Society ... [et al.] ; in co-operation with IEEE Reliability/CPMT/ED Chapter, Singapore and IEEE ED/AP Chapter, Bombay.
  Published: (2007)
• 2006 IEEE International Integrated Reliability Workshop final report Stanford Sierra Conference Center, S. Lake Tahoe, California, October 16-19, 2006 / sponsored by the IEEE Electron Devices Society and the IEEE Reliability Society.
  Published: (2006)
• 2007 IEEE International Integrated Reliability Workshop final report Stanford Sierra Conference Center, S. Lake Tahoe, California, October 15-18, 2007 / sponsored by the IEEE Electron Devices Society and the IEEE Reliability Society.
  Published: (2007)
• Proceedings of the IEEE 2006 Custom Integrated Circuits Conference Double Tree Hotel, September 10-13, 2006, San Jose, California / the CICC 2006 is sponsored by the IEEE Solid State Circuits Society and technically co-sponsored by the IEEE Electron Devices Society.
  Published: (2007)