Proceeding of the 15th International Symposium on the Physical & Failure Analysis of Integrated Circuits IPFA 2008 / edited by Gan Chee Lip ... [et al.] ; organised by IEEE ED/SSC Chapter. IPFA 2008 /
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Format: | eBook |
Language: | English |
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Piscataway, N.J. :
IEEE Reliability Society,
c2008.
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Online Access: | http://ieeexplore.ieee.org/servlet/opac?punumber=4579686 |
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http://ieeexplore.ieee.org/servlet/opac?punumber=4579686Online Resource - Electronic book
Copy [B377758] | Available |
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