Digital systems testing and testable design Miron Abramovici, Melvin A. Breuer, Arthur D. Friedman.

Digital systems testing and testable design Miron Abramovici, Melvin A. Breuer, Arthur D. Friedman.

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Bibliographic Details
Main Author: Abramovici, Miron
Other Authors: Breuer, Melvin A., Friedman, Arthur D.
Format: eBook
Language:English
Published: New York, NY : Computer Science Press, c1990.
Series:Electrical engineering communications and signal processing series.
Subjects:
Digital integrated circuits > Testing.
Digital integrated circuits > Design and construction.
Online Access:http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=5266057
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http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=5266057

Online Resource - Electronic book

Copy [B384272] Available

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