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  1. 1
    Fringe pattern analysis for optical metrology : theory, algorithms, and applications / Manuel Servin, J. Antonio Quiroga, and J. Moises Padilla.
    Subjects: '; “...Diffraction patterns Data processing....”
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  2. 2
    Surface scattering and diffraction for advanced metrology II : 9 July, 2002, Seattle, Washington, USA / Zu-Han Gu, Alexei A. Maradudin, chairs/editors ; sponsored and published by SPIE--the International Society for Optical Engineering ; cooperating organizations, the Boeing Company ... [et al.].
    Published 2002
    Subjects: '; “...Diffractive scattering Congresses...”
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