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Padilla, J. Moises (Jose Moises)
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Padilla, J. Moises (Jose Moises)
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Padilla, J. Moises (Jose Moises)
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Fringe pattern analysis for optical metrology : theory, algorithms, and applications / Manuel Servin, J. Antonio Quiroga, and J. Moises Padilla.
by
Servin, Manuel
,
Quiroga, J. Antonio (Juan Antonio)
,
Padilla
,
J
.
Moises
(
Jose
Moises
)
Published 2014
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Related Subjects
Data processing
Diffraction patterns
Image processing
Interferometry
Mathematical models
Metrology
Optical measurements
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