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  1. 1
    Fringe pattern analysis for optical metrology : theory, algorithms, and applications / Manuel Servin, J. Antonio Quiroga, and J. Moises Padilla.
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  2. 2
    Interferogram analysis for optical testing / Daniel Malacara, Manuel Servín, Zacarias Malacara.
    by Malacara, Daniel, 1937-
    Published 2005
    Edition: 2nd ed.
    Other Authors: '; “...Servín, Manuel...”
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