Fringe pattern analysis for optical metrology : theory, algorithms, and applications / Manuel Servin, J. Antonio Quiroga, and J. Moises Padilla. theory, algorithms, and applications /

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Bibliographic Details
Main Authors: Servin, Manuel (Author), Quiroga, J. Antonio (Juan Antonio) (Author), Padilla, J. Moises (Jose Moises) (Author)
Format: Book
Language:English
Published: Weinheim, Germany : Wiley-VCH Verlag GmbH & Co. KGaA, [2014]
Subjects:
Diffraction patterns > Data processing.
Image processing > Data processing.
Optical measurements.
Interferometry > Mathematical models.
Optical measurements > Mathematical models.
Diffraction patterns.
Metrology.
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Pilkington Library

Availability details from Pilkington Library
Shelfmark: 621.36/SER
Copy number Shelving location Availability
Copy [0404588980] Pilkington Main Collection Available

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