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  1. 1
    2009 27th IEEE VLSI Test Symposium proceedings : 37 May 2009 Santa Cruz, CA, USA ; VTS 2009 / [sponsored by] IEEE Computer Society.
    Published 2009
    “...IEEE Computer Society,...”
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  2. 2
    26th IEEE VLSI Test Symposium proceedings : San Diego, California, 27 April - 1 May 2008 / [sponsored by] IEEE Computer Society.
    Published 2008
    “...IEEE Computer Society,...”
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  3. 3
    MSE 2007 2007 IEEE International Conference on Microelectronic Systems Education : proceedings : 3-4 June 2007, San Diego, CA / sponsored by IEEE Computer Society Technical Committee on Design Automation, IEEE Computer Society Technical Committee on VLSI, IEEE Test Technology Technical Council.
    Published 2007
    “...IEEE Computer Society,...”
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  4. 4
    24th IEEE VLSI Test Symposium proceedings : April 30-May 4, 2006, Berkeley, California / sponsored by IEEE Computer Society Test Technology Technical Council.
    Published 2006
    “...IEEE Computer Society,...”
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  5. 5
    25th IEEE VLSI Test Symposium proceedings : 6-10 May, 2007, Berkeley, California / [sponsored by] IEEE Computer Society.
    Published 2007
    “...IEEE Computer Society,...”
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  6. 6
    The 23rd IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems proceedings, Boston, Massachusetts, 1-3 October 2008 / sponsored by the IEEE Computer Society Test Technology Technical Committee Council, the IEEE Computer Society Technical Committee on Fault Tolerant Computing ; edited by Cristiana Bolchini ... [et al.].
    Published 2008
    “...IEEE Computer Society Press,...”
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  7. 7
    Bridging faults and IDDQ testing / [edited by] Yashwant K. Malaiya and Rochit Rajsuman.
    Published 1992
    “...IEEE Computer Society Press,...”
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