24th IEEE VLSI Test Symposium proceedings : April 30-May 4, 2006, Berkeley, California / sponsored by IEEE Computer Society Test Technology Technical Council.

24th IEEE VLSI Test Symposium proceedings : April 30-May 4, 2006, Berkeley, California / sponsored by IEEE Computer Society Test Technology Technical Council. proceedings : April 30-May 4, 2006, Berkeley, California /

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Bibliographic Details
Corporate Authors: IEEE VLSI Test Symposium Berkeley, Calif., IEEE Computer Society. Test Technology Technical Committee, Institute of Electrical and Electronics Engineers, IEEE Xplore (Online service)
Format: eBook
Language:English
Published: Los Alamitos, Calif. : IEEE Computer Society, c2006.
Subjects:
Integrated circuits > Very large scale integration > Testing > Congresses.
Online Access:http://ieeexplore.ieee.org/servlet/opac?punumber=10758
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