25th IEEE VLSI Test Symposium proceedings : 6-10 May, 2007, Berkeley, California / [sponsored by] IEEE Computer Society. proceedings : 6-10 May, 2007, Berkeley, California /
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Corporate Authors: | , , |
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Format: | eBook |
Language: | English |
Published: |
Los Alamitos, Calif. :
IEEE Computer Society,
c2007.
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Online Access: | http://ieeexplore.ieee.org/servlet/opac?punumber=4209869 |
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http://ieeexplore.ieee.org/servlet/opac?punumber=4209869Online Resource - Electronic book
Copy [B376070] | Available |
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