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Testing
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IEEE Electron Devices Society
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Testing
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Testing
Integrated circuits
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IEEE/ACM International Conference on Computer Aided Design digest of technical papers, DoubleTree Hotel, San Jose, San Jose, California, November 5-8, 2007 / sponsored by IEEE ......
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ICMTS 2006 proceedings of the 2006 International Conference on Microelectronic Test Structures, Hyatt on Town Lake, Austin, Texas, March 6-9, 2006 / sponsored by the IEEE Electron...
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7th International Symposium on Quality Electronic Design ISQED 2006, proceedings : 27-29 March 2006, San Jose, California / technical sponsors, IEEE Electron Devices Society & IEEE...
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Proceedings of the 13th International Symposium on the Physical & Failure Analysis of Integrated Circuits IPFA 2006 / edited by Gan Chee Lip ... [et al.] ; organised by IEEE Reliab...
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Eighth International Symposium on Quality Electronic Design ISQED 2007 : proceedings : San Jose, California : 26-28 March, 2007 / [technical sponsors, IEEE Electron Device[s] Socie...
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Proceedings of the 14th International Symposium on the Physical & Failure Analysis of Integrated Circuits IPFA 2007 / edited by Souvik Mahapatra, M.K. Radhakrishnan ; organised by...
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2007 IEEE International Conference on Microelectronic Test Structures ICMTS : conference proceedings : March 19-22, Takeda Hall, The University of Tokyo, Japan / [sponsored by the...
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Ninth International Symposium on Quality Electronic Design ISQED 2008 : proceedings : San Jose, California : 17-19 March 2008 / technical sponsors, IEEE Electron Device[s] Society...
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IEEE Electron Devices Society
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International Symposium on Quality Electronic Design San Jose, Calif
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IEEE Reliability/CPMT/ED Singapore Chapter
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IEEE International Conference on Microelectronic Test Structures Austin, Tex
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IEEE International Conference on Microelectronic Test Structures University of Tokyo
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IEEE/ACM International Conference on Computer-Aided Design San Jose, Calif
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Institute of Electrical and Electronics Engineers
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International Symposium on the Physical & Failure Analysis of Integrated Circuits Indian Institute of Science
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International Symposium on the Physical & Failure Analysis of Integrated Circuits Singapore
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Mahapatra, Souvik
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Radhakrishnan, M. K.
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