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Integrated circuits
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IEEE Computer Society. Technical Council on Test Technology
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Integrated circuits
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Integrated circuits
Testing
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Design
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Eleventh IEEE European Test Symposium ETS 2006 : proceedings : 21-24 May, 2006, [Hilton Hotel] Southampton, United Kingdom.
Published 2006
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Proceedings of the 2006 IEEE Workshop on Design and Diagnostics of Electronic Circuits and Systems April 18-21, 2006, Prague, Czech Republic / sponsored by IEEE Computer Society Te...
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The 21st IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems proceedings : Arlington, Virginia, USA, October 4-6, 2006 / [edited by Nohpill Park ... [et al.]...
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Sixth International Workshop on Microprocessor Test and Verification common challenges and solutions : MTV 2005 : proceedings : Austin, Texas, 3-4 November, 2005 / sponsored by IEE...
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Proceedings of the 2007 IEEE Workshop on Design and Diagnostics of Electronic Circuits and Systems April 11-13, 2007, Krakow, Poland / sponsored by IEEE Computer Society Test Techn...
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Proceedings, Thirteenth IEEE European Test Symposium ETS 2008 : 25-29 May, 2008, Verbania, Italy : proceedings / [sponsored by TTTC].
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2008 IEEE Workshop on Design and Diagnostics of Electronic Circuits and Systems proceedings, April 16-18, 2008, Bratislava, Slovaka / sponsored by IEEE Computer Society, Test Techn...
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MTV 2007 Eighth International Workshop on Microprocessor Test and Verification : proceedings, 5-6 December, 2007, Austin. Texas, USA / sponsored by IEEE Computer Society Test Techn...
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Seventh International Workshop on Microprocessor Test and Verification proceedings : MTV 2006 : Austin, Texas, 4-5 December, 2006 / sponsored by IEEE Computer Society Test Technolo...
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ETS 2007 12th IEEE European Test Symposium : proceedings : 20-24 May 2007, Freiburg, Germany / [sponsored by TTTC].
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Proceedings of the 2009 IEEE Symposium on Design and Diagnostics of Electronic Circuits and Systems April 15-17, 2009, Liberec, Czech Republic / sponsored by IEEE Computer Society,...
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IEEE Computer Society. Technical Council on Test Technology
IEEE Xplore (Online service)
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International Workshop on Microprocessor Test and Verification Austin, Tex
3
Abadir, M.
1
Ceske vysoke uceni technicke v Praze
1
Girard, Patrick, Ph. D.
1
IEEE Computer Society. Fault-Tolerant Computing Technical Committee
1
IEEE European Test Symposium Freiburg, Germany
1
IEEE European Test Symposium Southampton, England
1
IEEE European Test Symposium Verbania, Italy
1
IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems Arlington, Va
1
IEEE Symposium on Design and Diagnostics of Electronic Circuits and Systems Liberec, Czech Republic
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IEEE Workshop on Design and Diagnostics of Electronic Circuits and Systems Bratislava, Slovakia
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IEEE Workshop on Design and Diagnostics of Electronic Circuits and Systems Krakow, Poland
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IEEE Workshop on Design and Diagnostics of Electronic Circuits and Systems Prague, Czech Republic
1
Institute of Electrical and Electronics Engineers
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Park, Nohpill
1
Politechnika Slaska im. W. Pstrowskiego
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Renovell, M. (Michel)
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Slovenska akademia vied. Institute of Informatics
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Straube, Bernd
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Technicka univerzita v Liberci. Institute of Information Technology and Electronics
1
Wang, Li-C., 1963-
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