The 21st IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems proceedings : Arlington, Virginia, USA, October 4-6, 2006 / [edited by Nohpill Park ... [et al.] ; sponsored by the IEEE Computer Society Test Technology Technical Council ; the IEEE Computer Society Technical Committee on Fault-Tolerant Computing]. proceedings : Arlington, Virginia, USA, October 4-6, 2006 /
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Format: | eBook |
Language: | English |
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Los Alamitos, Calif. :
IEEE Computer Society,
c2006.
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Online Access: | http://ieeexplore.ieee.org/servlet/opac?punumber=4030903 |
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http://ieeexplore.ieee.org/servlet/opac?punumber=4030903Online Resource - Electronic book
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