Characterisation of laser scribes in thin film photovoltaics by coherence correlation interferometry

Characterisation of laser scribes in thin film photovoltaics by coherence correlation interferometry

In this paper we present results measuring the precise shape of laser scribes in thin film photovoltaics using Coherence Correlation Interferometry (CCI). Laser ablation is used in interconnect processes in all types of thin film devices, including those based on CdTe, CIGS and amorphous silicon. Th...

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Bibliographic Details
Main Authors: Bianca Maniscalco, Piotr Kaminski, Gianfranco Claudio, Michael Walls, Y. Yu, D. Mansfield, M. Crozier, A. Brunton
Format: Default Conference proceeding
Published: 2012
Subjects:
CdTe
Laser processing
Module integration
Surface metrology
Online Access:https://hdl.handle.net/2134/14670
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https://hdl.handle.net/2134/14670

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