Depth-resolved imaging and displacement measurement techniques viewed as linear filtering operations

The last 5 years have seen the emergence of a family of optical interferometric techniques that provide deformation measurements throughout three-dimensional (3-D) weakly scattering materials. They include wavelength scanning interferometry (WSI), tilt scanning interferometry (TSI), phase contrast s...

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Bibliographic Details
Main Authors: Pablo Ruiz, Jonathan Huntley, Jeremy Coupland
Format: Default Article
Published: 2011
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Online Access:https://hdl.handle.net/2134/13318
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