Combined effects of surface oxidation and interfacial intermetallic compound growth on solderability degradation of electrodeposited tin thin films on copper substrate due to isothermal ageing

© 2018 Elsevier Ltd We report new insights into the solder wettability degradation of Sn thin films on Cu under 155 °C isothermal ageing. A multiscale wettability degradation model was established, reflecting quantitatively the surface oxidation and interfacial intermetallic compound (IMC) growth, o...

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Bibliographic Details
Main Authors: Jing Wang, Guang Chen, Fulong Sun, Zhaoxia Zhou, Zhi-Quan Liu, Changqing Liu
Format: Default Article
Published: 2018
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Online Access:https://hdl.handle.net/2134/34743
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