Electroluminescence imaging of PV devices: single-time-effect statistics and removal

The statistics and removal of occurring specific image artefacts (i.e. single-time-effects [STE]) during qualitative analysis of EL imaging is discussed. STE are caused by single nuclear particles such as heavy ions, along with neutrons and protons with energies above 10 MeV. When charged particles...

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Main Authors:	Karl Bedrich, Martin Bliss, Tom Betts, Ralph Gottschalg
Format:	Default Conference proceeding
Published:	2016
Subjects:	Mechanical engineering not elsewhere classified Electroluminescence Devices Calibration Image quality Evaluation Mechanical Engineering not elsewhere classified
Online Access:	https://hdl.handle.net/2134/22899
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id	rr-article-9552443
record_format	Figshare
spelling	rr-article-95524432016-01-01T00:00:00Z Electroluminescence imaging of PV devices: single-time-effect statistics and removal Karl Bedrich (1257453) Martin Bliss (1250019) Tom Betts (1258395) Ralph Gottschalg (1247661) Mechanical engineering not elsewhere classified Electroluminescence Devices Calibration Image quality Evaluation Mechanical Engineering not elsewhere classified The statistics and removal of occurring specific image artefacts (i.e. single-time-effects [STE]) during qualitative analysis of EL imaging is discussed. STE are caused by single nuclear particles such as heavy ions, along with neutrons and protons with energies above 10 MeV. When charged particles cross the sensitive region of the CCD matrix, they cause effects of ionization and lead to spots only visible once after signal readout. Depending on whether STE occur in the EL image with sample excitation or in the background image without, they are visible in the corrected EL image as bright or dark spots. These can be confused conceivably with cell defects. Within this work the intensity offset due to STE as well as their occurrence over time is evaluated for multiple EL images. For the examined setup it is shown that the disruptive influence of STE is visible for measured cell voltages under 0.65 V. For this case a robust STE removal method is proposed using an additional EL image taken in series. 2016-01-01T00:00:00Z Text Conference contribution 2134/22899 https://figshare.com/articles/conference_contribution/Electroluminescence_imaging_of_PV_devices_single-time-effect_statistics_and_removal/9552443 CC BY-NC-ND 4.0
institution	Loughborough University
collection	Figshare
topic	Mechanical engineering not elsewhere classified Electroluminescence Devices Calibration Image quality Evaluation Mechanical Engineering not elsewhere classified
spellingShingle	Mechanical engineering not elsewhere classified Electroluminescence Devices Calibration Image quality Evaluation Mechanical Engineering not elsewhere classified Karl Bedrich Martin Bliss Tom Betts Ralph Gottschalg Electroluminescence imaging of PV devices: single-time-effect statistics and removal
description	The statistics and removal of occurring specific image artefacts (i.e. single-time-effects [STE]) during qualitative analysis of EL imaging is discussed. STE are caused by single nuclear particles such as heavy ions, along with neutrons and protons with energies above 10 MeV. When charged particles cross the sensitive region of the CCD matrix, they cause effects of ionization and lead to spots only visible once after signal readout. Depending on whether STE occur in the EL image with sample excitation or in the background image without, they are visible in the corrected EL image as bright or dark spots. These can be confused conceivably with cell defects. Within this work the intensity offset due to STE as well as their occurrence over time is evaluated for multiple EL images. For the examined setup it is shown that the disruptive influence of STE is visible for measured cell voltages under 0.65 V. For this case a robust STE removal method is proposed using an additional EL image taken in series.
format	Default Conference proceeding
author	Karl Bedrich Martin Bliss Tom Betts Ralph Gottschalg
author_facet	Karl Bedrich Martin Bliss Tom Betts Ralph Gottschalg
author_sort	Karl Bedrich (1257453)
title	Electroluminescence imaging of PV devices: single-time-effect statistics and removal
title_short	Electroluminescence imaging of PV devices: single-time-effect statistics and removal
title_full	Electroluminescence imaging of PV devices: single-time-effect statistics and removal
title_fullStr	Electroluminescence imaging of PV devices: single-time-effect statistics and removal
title_full_unstemmed	Electroluminescence imaging of PV devices: single-time-effect statistics and removal
title_sort	electroluminescence imaging of pv devices: single-time-effect statistics and removal
publishDate	2016
url	https://hdl.handle.net/2134/22899
_version_	1797556636977463296

Electroluminescence imaging of PV devices: single-time-effect statistics and removal

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