Electroluminescence imaging of PV devices: single-time-effect statistics and removal

The statistics and removal of occurring specific image artefacts (i.e. single-time-effects [STE]) during qualitative analysis of EL imaging is discussed. STE are caused by single nuclear particles such as heavy ions, along with neutrons and protons with energies above 10 MeV. When charged particles...

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Bibliographic Details
Main Authors: Karl Bedrich, Martin Bliss, Tom Betts, Ralph Gottschalg
Format: Default Conference proceeding
Published: 2016
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Online Access:https://hdl.handle.net/2134/22899
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