Automated characterisation of multi-junction thin film silicon solar cells
Accurate measurements and calibration of amorphous silicon and micromorph multi-junction solar cells poses a major challenge. Device measurements with commonly used single-lamp solar simulators can be associated with large uncertainties, as small changes in the simulator light can lead to significan...
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| Main Authors: | , , , , |
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| Format: | Default Conference proceeding |
| Published: |
2009
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| Subjects: | |
| Online Access: | https://hdl.handle.net/2134/5388 |
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