Comparative study of the structural and optical properties of epitaxial CuFeO2 and CuFe1 - xGaxO2 delafossite thin films grown by pulsed laser deposition methods
Three samples of epitaxial delafossite CuFeO2 and CuFe1 − xGaxO2 films were grown using Pulsed Laser Deposition techniques in high vacuum. The sample thicknesses were estimated to be 21 nm, 75 nm for the CuFeO2 films and ~ 37 nm for the composite sample containing gallium. The estimated gallium frac...
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| Main Authors: | , , , , , , |
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| Format: | Default Article |
| Published: |
2017
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| Subjects: | |
| Online Access: | https://hdl.handle.net/2134/25819 |
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