Design and test technology for dependable systems-on-chip Raimund Ubar, Jaan Raik, and Heinrich Theodor Vierhaus, editors.
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Corporate Author: | IGI Global |
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Other Authors: | Ubar, Raimund, 1941-, Raik, Jaan, 1972-, Vierhaus, Heinrich Theodor, 1951- |
Format: | eBook |
Language: | English |
Published: |
Hershey, Pa. :
IGI Global (701 E. Chocolate Avenue, Hershey, Pennsylvania, 17033, USA),
c2011.
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Subjects: | |
Online Access: | http://services.igi-global.com/resolvedoi/resolve.aspx?doi=10.4018/978-1-60960-212-3 |
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