Design and test technology for dependable systems-on-chip Raimund Ubar, Jaan Raik, and Heinrich Theodor Vierhaus, editors.

Design and test technology for dependable systems-on-chip Raimund Ubar, Jaan Raik, and Heinrich Theodor Vierhaus, editors.

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Bibliographic Details
Corporate Author: IGI Global
Other Authors: Ubar, Raimund, 1941-, Raik, Jaan, 1972-, Vierhaus, Heinrich Theodor, 1951-
Format: eBook
Language:English
Published: Hershey, Pa. : IGI Global (701 E. Chocolate Avenue, Hershey, Pennsylvania, 17033, USA), c2011.
Subjects:
Systems on a chip > Design and construction.
Networks on a chip > Design and construction.
Systems on a chip > Testing.
Networks on a chip > Testing.
Online Access:http://services.igi-global.com/resolvedoi/resolve.aspx?doi=10.4018/978-1-60960-212-3
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