APA Edition Citation

IGI Global, Ubar, R., Raik, J., & Vierhaus, H. T. (2011). Design and test technology for dependable systems-on-chip Raimund Ubar, Jaan Raik, and Heinrich Theodor Vierhaus, editors. IGI Global (701 E. Chocolate Avenue, Hershey, Pennsylvania, 17033, USA).

Chicago Edition Citation

IGI Global, Raimund Ubar, Jaan Raik, and Heinrich Theodor Vierhaus. Design and Test Technology for Dependable Systems-on-chip Raimund Ubar, Jaan Raik, and Heinrich Theodor Vierhaus, Editors. Hershey, Pa.: IGI Global (701 E. Chocolate Avenue, Hershey, Pennsylvania, 17033, USA), 2011.

MLA Edition Citation

IGI Global, et al. Design and Test Technology for Dependable Systems-on-chip Raimund Ubar, Jaan Raik, and Heinrich Theodor Vierhaus, Editors. IGI Global (701 E. Chocolate Avenue, Hershey, Pennsylvania, 17033, USA), 2011.