Symposium on x-ray and electron probe analysis presented at the sixty-sixth annual meeting, American Society for Testing and Materials, Atlantic City, N. J., June 27, 1963.

Symposium on x-ray and electron probe analysis presented at the sixty-sixth annual meeting, American Society for Testing and Materials, Atlantic City, N. J., June 27, 1963. presented at the sixty-sixth annual meeting, American Society for Testing and Materials, Atlantic City, N. J., June 27, 1963.

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Bibliographic Details
Corporate Authors: Symposium on X-ray and Electron Probe Analysis Atlantic City, N.J., ASTM Committee E-2 on Emission Spectroscopy, American Society for Testing and Materials. Committee E-4 on Metallography, American Society for Testing and Materials. Meeting, American Society for Testing and Materials
Format: eBook
Language:English
Published: Philadelphia, Pa. : American Society for Testing and Materials, c1964.
Series:Journal of ASTM International. Selected technical papers ; STP 349.
Subjects:
X-ray spectroscopy > Congresses.
Probes (Electronic instruments) > Congresses.
X-ray microanalysis > Congresses.
Online Access:https://compass.astm.org/document/?contentCode=ASTM%7CSTP349-EB%7Cen-US&proxycl=https%3A%2F%2Fsecure.astm.org&fromLogin=true
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