Electron beam microanalysis by D. R. Beaman and J. A. Isasi.

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Bibliographic Details
Main Author: Beaman, Donald Robert
Corporate Author: American Society for Testing and Materials
Other Authors: Isasi, J. A. (joint author.)
Format: eBook
Language:English
Published: Philadelphia, Pa. : American Society for Testing and Materials, c1972.
Series:Journal of ASTM International. Selected technical papers ; STP 506.
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Online Access:https://compass.astm.org/document/?contentCode=ASTM%7CSTP506-EB%7Cen-US
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