X-ray diffraction for materials research : from fundamentals to applications / Myeongkyu Lee, PhD. from fundamentals to applications /

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Bibliographic Details
Main Author: Lee, Myeongkyu
Format: Book
Language:English
Published: Oakville, ON, Canada ; Waretown, NJ, USA : Apple Academic Press, [2016]
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Pilkington Library - Pilkington Main Collection

Shelfmark: 620.11272/LEE
Copy [0404729231] Available