Microelectronic reliability. [edited by] Edward B. Hakim. Vol. 1, Reliability, test and diagnostics ;
Saved in:
| Other Authors: | |
|---|---|
| Format: | Book |
| Language: | English |
| Published: |
Norwood, Mass. :
Artech House,
c1989.
|
| Subjects: | |
| Tags: |
Add Tag
No Tags, Be the first to tag this record!
|
Pilkington Library - Pilkington Main Collection
| Shelfmark: |
621.38152/MIC |
|---|---|
| Copy [0403898927] | Available |