Testing for EMC compliance approaches and techniques / Mark I. Montrose, Edward M. Nakauchi. approaches and techniques /

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Bibliographic Details
Main Author: Montrose, Mark I.
Corporate Author: John Wiley & Sons
Other Authors: Nakauchi, Edward M.
Format: eBook
Language:English
Published: Hoboken, NJ : John Wiley, 2004.
Subjects:
Electromagnetic compatibility.
Electromagnetic interference.
Online Access:http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=5237008
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http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=5237008

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Copy [B384587] Electronic book Available

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