Twenty Third Annual IEEE Semiconductor Thermal Measurement and Management Symposium SEMI-THERM Proceedings 2007, San Jose, CA USA, March 18-22, 2007 / IEEE, IEEE Components and Manufacturing Technology Society and NIST National Institute of Standards and Technology.

Twenty Third Annual IEEE Semiconductor Thermal Measurement and Management Symposium SEMI-THERM Proceedings 2007, San Jose, CA USA, March 18-22, 2007 / IEEE, IEEE Components and Manufacturing Technology Society and NIST National Institute of Standards and Technology. SEMI-THERM Proceedings 2007, San Jose, CA USA, March 18-22, 2007 /

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Bibliographic Details
Corporate Authors: IEEE Semiconductor Thermal Measurement and Management Symposium San Jose, Calif., Components, Packaging & Manufacturing Technology Society, National Institute of Standards and Technology (U.S.)
Format: eBook
Language:English
Published: [Piscataway, N.J.] : IEEE, 2007.
Subjects:
Semiconductors > Thermal properties > Congresses.
Semiconductors > Cooling > Congresses.
Online Access:http://ieeexplore.ieee.org/servlet/opac?punumber=4160867
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