Proceedings of the 16th Asian Test Symposium : 8-11 October, 2007, Beijing, China / sponsored by IEEE Computer Society Test Technology Council (TTTC), Institute of Computing Technology, Chinese Academy of Sciences ; in cooperation with Technical Committee on Fault Tolerant Computing of CCF, National Natural Science Foundation of China (NSFC).

Proceedings of the 16th Asian Test Symposium : 8-11 October, 2007, Beijing, China / sponsored by IEEE Computer Society Test Technology Council (TTTC), Institute of Computing Technology, Chinese Academy of Sciences ; in cooperation with Technical Committee on Fault Tolerant Computing of CCF, National Natural Science Foundation of China (NSFC). 8-11 October, 2007, Beijing, China /

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Bibliographic Details
Corporate Authors: Asian Test Symposium Beijing, China, IEEE Computer Society. Technical Council on Test Technology, Institute of Computing Technology, IEEE Computer Society. Fault-Tolerant Computing Technical Committee, Guo jia zi ran ke xue ji jin wei yuan hui (China)
Format: eBook
Language:English
Published: Los Alamitos, Calif. : IEEE Computer Society, c2007.
Subjects:
Electronic digital computers > Circuits > Testing > Congresses.
Electronic circuits > Testing > Congresses.
Fault-tolerant computing > Congresses.
Online Access:http://ieeexplore.ieee.org/servlet/opac?punumber=4385341
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