2006 International Symposium on VLSI Design, Automation, and Test (VLSI-DAT) proceedings of technical papers : April 26-28, 2006 : Hsinchu, Taiwan / Industrial Technology Research Institute, IEEE.

2006 International Symposium on VLSI Design, Automation, and Test (VLSI-DAT) proceedings of technical papers : April 26-28, 2006 : Hsinchu, Taiwan / Industrial Technology Research Institute, IEEE. proceedings of technical papers : April 26-28, 2006 : Hsinchu, Taiwan /

Show all versions (2)
Saved in:
Bibliographic Details
Corporate Authors: International Symposium on VLSI Design, Automation, and Test Hsin-chu shih, Taiwan, Gong ye ji shu yan jiu yuan, Institute of Electrical and Electronics Engineers, IEEE Xplore (Online service)
Format: eBook
Language:English
Published: Piscataway, NJ : IEEE, c2006.
Subjects:
Integrated circuits > Very large scale integration > Congresses.
Online Access:http://ieeexplore.ieee.org/servlet/opac?punumber=4027472
Tags: Add Tag
No Tags, Be the first to tag this record!
Login for hold information

Internet

http://ieeexplore.ieee.org/servlet/opac?punumber=4027472

Online Resource - Electronic book

Copy [B375955] Available

Similar Items