Optical inspection of microsystems / edited by Wolfgang Osten.

Saved in:
Bibliographic Details
Other Authors: Osten, Wolfgang
Format: Book
Language:English
Published: Boca Raton, Fla. : CRC/Taylor & Francis, 2007.
Series:Optical science and engineering (Boca Raton, Fla.) ; v. 109
Subjects:
Tags: Add Tag
No Tags, Be the first to tag this record!

Pilkington Library - Pilkington Main Collection

Shelfmark: 670.425/OPT
Copy [0403368723] Available