Materials science in microelectronics. E.S. Machlin. Vol. 2, The effects of structure on properties in thin films /
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| Main Author: | |
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| Format: | Book |
| Language: | English |
| Published: |
Oxford :
Elsevier,
2006.
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| Edition: | 2nd ed. |
| Subjects: | |
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Pilkington Library - Pilkington Main Collection
| Shelfmark: |
621.38152/MAC |
|---|---|
| Copy [0403210224] | Available |