Statistical regression with measurement error / Chi-Lun Cheng and John W. Van Ness.

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Bibliographic Details
Main Author: Cheng, Chi-Lun
Other Authors: Van Ness, John W.
Format: Book
Language:English
Published: London : Arnold, 1999
Series:Kendall's library of statistics ; 6
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Pilkington Library - Pilkington Main Collection

Shelfmark: 519.536/CHE
Copy [0402056345] Available