Photometric determination of traces of metals : general aspects / [by] E.B. Sandell, Hiroshi Onishi. general aspects /
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Format: | Book |
Language: | English |
Published: |
New York ; Chichester (etc.) :
Wiley,
1978.
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Edition: | 4th ed. |
Series: | Chemical analysis ;
v.3, Pt 1 |
Subjects: | |
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Pilkington Library - Pilkington Main Collection
Shelfmark: |
545.812/SAN |
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Copy [019505301] | Available |