Attribute sampling plans, tables of tests, and confidence limits for proportions / Robert E. Odeh, D.B. Owen.
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Format: | Book |
Language: | English |
Published: |
New York :
M. Dekker,
c1983
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Series: | Statistics : textbooks and monographs ;
vol.49 |
Subjects: | |
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Pilkington Library - Pilkington Main Collection
Shelfmark: |
519.52/ODE |
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Copy [026566401] | Not for loan |