High resolution potentiometry of planar electroformed MIM structures

Many attempts have been made to detect the current carrying filaments in electroformed metal-insulator-metal (MIM) structures (Pagnia and Sotnik 1988, Pagnia 1990). Transmission and scanning electron microscopes have been used without real success. Even experiments with the scanning tunnelling micro...

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Bibliographic Details
Published in:International journal of electronics 1992-11, Vol.73 (5), p.833-835
Main Authors: PAGNIA, H., SOTNIK, N., WIRTH, W.
Format: Article
Language:English
Subjects:
Engineering
Engineering, Electrical & Electronic
Science & Technology
Technology
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Summary:Many attempts have been made to detect the current carrying filaments in electroformed metal-insulator-metal (MIM) structures (Pagnia and Sotnik 1988, Pagnia 1990). Transmission and scanning electron microscopes have been used without real success. Even experiments with the scanning tunnelling microscope (STM) could not definitely detect the filaments. We have mapped the potential distribution on an electroformed planar MIM diode (gold on quartz glass) with an STM and found usually only one (sometimes a few) sharp potential drop(s) in the microslit.
ISSN:0020-7217
1362-3060
DOI:10.1080/00207219208925718