A model for excess Johnson noise in superconducting transition-edge sensors

Transition-edge sensors (TESs) are two-dimensional superconducting films utilized as highly sensitive detectors of energy or power. These detectors are voltage biased in the superconducting-normal transition where the film resistance is both finite and a strong function of temperature. Unfortunately...

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Bibliographic Details
Published in:Applied physics letters 2021-05, Vol.118 (20)
Main Authors: Wessels, Abigail, Morgan, Kelsey, Gard, Johnathon D., Hilton, Gene C., Mates, John A. B., Reintsema, Carl D., Schmidt, Daniel R., Swetz, Daniel S., Ullom, Joel N., Vale, Leila R., Bennett, Douglas A.
Format: Article
Language:English
Subjects:
Applied physics
Detectors
Electric potential
Electrical noise
Noise
Noise prediction
Power spectral density
Sensors
Superconducting films
Superconductivity
Thermal noise
Voltage
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Summary:Transition-edge sensors (TESs) are two-dimensional superconducting films utilized as highly sensitive detectors of energy or power. These detectors are voltage biased in the superconducting-normal transition where the film resistance is both finite and a strong function of temperature. Unfortunately, the amount of electrical noise observed in TESs exceeds the predictions of existing noise theories. We describe a possible mechanism for the unexplained excess noise, which we term “mixed-down noise.” The source is Johnson noise, which is mixed down to low frequencies by Josephson oscillations in devices with a nonlinear current–voltage relationship. We derive an expression for the power spectral density of this noise and show that its predictions agree with measured data.
ISSN:0003-6951
1077-3118
DOI:10.1063/5.0043369