Characterization of magnetomechanical properties in FeGaB thin films

Layered magnetic/piezoelectric heterostructures have drawn a great amount of interest for their potential use in ultra-sensitive magnetoelectric (ME) sensors, ME antennas, voltage tunable inductors, magnetic tunable resonators, etc. It is critically important to characterize the saturation magnetost...

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Bibliographic Details
Published in:Applied physics letters 2018-12, Vol.113 (26)
Main Authors: Dong, Cunzheng, Li, Menghui, Liang, Xianfeng, Chen, Huaihao, Zhou, Haomiao, Wang, Xinjun, Gao, Yuan, McConney, Michael E., Jones, John G., Brown, Gail J., Howe, Brandon M., Sun, Nian X.
Format: Article
Language:English
Subjects:
Applied physics
Coupling
Heterostructures
Inductors
Magnetic properties
Magnetic thin films
Magnetoelastic effect
Magnetomechanical properties
Magnetostriction
Modulus of elasticity
Piezoelectricity
Silicon substrates
Thin films
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Summary:Layered magnetic/piezoelectric heterostructures have drawn a great amount of interest for their potential use in ultra-sensitive magnetoelectric (ME) sensors, ME antennas, voltage tunable inductors, magnetic tunable resonators, etc. It is critically important to characterize the saturation magnetostriction, piezomagnetic coefficient, ΔE effect, and magnetomechanical coupling factor of magnetic thin films, which determine the performance of these ME devices. In this work, a sensitive system has been developed to measure these magnetomechanical properties, on which several different magnetostrictive thin films on the silicon substrate cantilever were characterized. A 0.015 ppm limit of detection of the magnetostriction tester and a frequency resolution of 0.01 Hz of the ΔE tester have been achieved. After magnetic anneal treatment, a record high piezomagnetic coefficient of 12 ppm/Oe, a giant magnetic field induced Young's modulus change of 153 GPa, and a high effective magnetomechanical coupling factor of 0.84 have been measured in FeGaB thin films.
ISSN:0003-6951
1077-3118
DOI:10.1063/1.5065486