Structural and electrical properties of nanostructured ZnO

Nanostructured zinc oxide (ZnO) thin film was deposited using immersion method. The molarity was varied in range of 0.02 to 0.10 M in this study. The surface morphology was observed by field emission scanning microscopy (FESEM). Meanwhile, the roughness were characterised by atomic force microscopy...

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Bibliographic Details
Main Authors: Shafura, A. K., Saurdi, I., Sin, N. D. Md, Noor, Uzer Mohd, Mamat, M. H., Alrokayan, Salman A. H., Khan, Haseeb A., Rusop, M.
Format: Conference Proceeding
Language:English
Online Access:Get full text
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Summary:Nanostructured zinc oxide (ZnO) thin film was deposited using immersion method. The molarity was varied in range of 0.02 to 0.10 M in this study. The surface morphology was observed by field emission scanning microscopy (FESEM). Meanwhile, the roughness were characterised by atomic force microscopy (AFM). The current-voltage (I-V) measurement was done to determine its electrical properties. Flake-like morphology was found to increase the electrical properties of nanostructured ZnO thin film. The uniformity was increased when the molarity was increased.
ISSN:0094-243X
1551-7616
DOI:10.1063/1.5036898