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Investigation of spin scattering mechanism in silicon channels of Fe/MgO/Si lateral spin valves
The temperature evolution of spin relaxation time, τ sf, in degenerate silicon (Si)-based lateral spin valves is investigated by means of the Hanle effect measurements. τ sf at 300 K is estimated to be 1.68 ± 0.03 ns and monotonically increased with decreasing temperature down to 100 K. Below 100 K,...
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Published in: | Applied physics letters 2017-05, Vol.110 (19) |
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Main Authors: | , , , , , , |
Format: | Article |
Language: | English |
Citations: | Items that this one cites Items that cite this one |
Online Access: | Get full text |
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Summary: | The temperature evolution of spin relaxation time, τ
sf, in degenerate silicon (Si)-based lateral spin valves is investigated by means of the Hanle effect measurements. τ
sf at 300 K is estimated to be 1.68 ± 0.03 ns and monotonically increased with decreasing temperature down to 100 K. Below 100 K, in contrast, it shows almost a constant value of ca. 5 ns. The temperature dependence of the conductivity of the Si channel shows a similar behavior to that of the τ
sf, i.e., monotonically increasing with decreasing temperature down to 100 K and a weak temperature dependence below 100 K. The temperature evolution of conductivity reveals that electron scattering due to magnetic impurities is negligible. A comparison between τ
sf and momentum scattering time reveals that the dominant spin scattering mechanism in the Si is the Elliott-Yafet mechanism, and the ratio of the momentum scattering time to the τ
sf attributed to nonmagnetic impurities is approximately 3.77 × 10−6, which is more than two orders of magnitude smaller than that of copper. |
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ISSN: | 0003-6951 1077-3118 |
DOI: | 10.1063/1.4982966 |