observation of charge transfer and crystal field formation high energy resolution X-ray spectroscopy during temperature programmed oxidation

Herein, it has been demonstrated how resonant X-ray emission spectroscopy can be employed to study the charge transfer dynamics in real-time during the temperature-induced oxidation of metallic tungsten. Application of high energy resolution schemes allowed distinguishing charge transfer to separate...

Full description

Saved in:
Bibliographic Details
Published in:Physical chemistry chemical physics : PCCP 2020-07, Vol.22 (26), p.14731-14735
Main Authors: Wach, Anna, B achucki, Wojciech, Czapla-Masztafiak, Joanna, Abreu Fernandes, Daniel Luis, Bana, Dariusz, Wojtaszek, Klaudia, Tyrala, Krzysztof, Kwiatek, Wojciech M, Sá, Jacinto, Szlachetko, Jakub
Format: Article
Language:English
Online Access:Get full text
Tags: Add Tag
No Tags, Be the first to tag this record!
Description
Summary:Herein, it has been demonstrated how resonant X-ray emission spectroscopy can be employed to study the charge transfer dynamics in real-time during the temperature-induced oxidation of metallic tungsten. Application of high energy resolution schemes allowed distinguishing charge transfer to separate orbitals resulting from crystal field splitting. Based on the time-resolved studies, it was possible to determine the corresponding charge transfer rates. From the experimental data, we determined that the electron transfer during the thermal oxidation of the metal dominates in the temperature range of 470-570 °C, reaching a maximum of 0.036 electrons per °C. In this paper, we demonstrated how high energy resolution resonant X-ray emission spectroscopy can be employed to study the charge transfer dynamics in real-time during the temperature-induced oxidation of metallic tungsten.
ISSN:1463-9076
1463-9084
DOI:10.1039/d0cp01974g