Investigation of Cavity Enhanced XEOL of a Single ZnO Microrod by Using Multifunctional Hard X-ray Nanoprobe

The multifunctional hard X-ray nanoprobe at Taiwan Photon Source (TPS) exhibits the excellent ability to simultaneously characterize the X-ray absorption, X-ray excited optical luminescence (XEOL) as well as the dynamics of XEOL of materials. Combining the scanning electron microscope (SEM) into the...

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Bibliographic Details
Published in:Scientific reports 2019-01, Vol.9 (1), p.207-207, Article 207
Main Authors: Lin, Bi-Hsuan, Li, Xiao-Yun, Lin, Dai-Jie, Jian, Bo-Lun, Hsu, Hsu-Cheng, Chen, Huang-Yen, Tseng, Shao-Chin, Lee, Chien-Yu, Chen, Bo-Yi, Yin, Gung-Chian, Hsu, Ming-Ying, Chang, Shih-Hung, Tang, Mau-Tsu, Hsieh, Wen-Feng
Format: Article
Language:English
Subjects:
Energy
Investigations
Luminescence
Morphology
Optical properties
Oscillations
Photonics
Photons
Radiation
Scanning electron microscopy
Spatial discrimination
Spectrum analysis
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Summary:The multifunctional hard X-ray nanoprobe at Taiwan Photon Source (TPS) exhibits the excellent ability to simultaneously characterize the X-ray absorption, X-ray excited optical luminescence (XEOL) as well as the dynamics of XEOL of materials. Combining the scanning electron microscope (SEM) into the TPS 23A end-station, we can easily and quickly measure the optical properties to map out the morphology of a ZnO microrod. A special phenomenon has been observed that the oscillations in the XEOL associated with the confinement of the optical photons in the single ZnO microrod shows dramatical increase while the X-ray excitation energy is set across the Zn K-edge. Besides having the nano-scale spatial resolution, the synchrotron source also gives a good temporal domain measurement to investigate the luminescence dynamic process. The decay lifetimes of different emission wavelengths and can be simultaneously obtained from the streak image. Besides, SEM can provide the cathodoluminescence (CL) to be a complementary method to analyze the emission properties of materials, we anticipate that the X-ray nanoprobe will open new avenues with great characterization ability for developing nano/microsized optoelectronic devices.
ISSN:2045-2322
2045-2322
DOI:10.1038/s41598-018-36764-8