Pump-probe spectrometer for measuring x-ray induced strain

A hard x-ray pump-probe spectrometer using a multi-crystal Bragg reflector is demonstrated at a third generation synchrotron source. This device derives both broadband pump and monochromatic probe pulses directly from a single intense, broadband x-ray pulse centered at 8.767 keV. We present a proof-...

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Bibliographic Details
Published in:Optics letters 2016-05, Vol.41 (9), p.1977-1980
Main Authors: Loether, A, Adams, B W, DiCharia, A, Gao, Y, Henning, R, Walko, D A, DeCamp, M F
Format: Article
Language:English
Subjects:
INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY
Spectroscopy
Synchrotron radiation
time-resolved
X-ray optics
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Summary:A hard x-ray pump-probe spectrometer using a multi-crystal Bragg reflector is demonstrated at a third generation synchrotron source. This device derives both broadband pump and monochromatic probe pulses directly from a single intense, broadband x-ray pulse centered at 8.767 keV. We present a proof-of-concept experiment which directly measures x-ray induced crystalline lattice strain.
ISSN:0146-9592
1539-4794
DOI:10.1364/OL.41.001977